Document Type
Article
Version Deposited
Published Version
Publication Date
8-20-2020
Publication Title
Crystals
DOI
10.3390/cryst10090728
Abstract
In this work, we present a grazing incidence X-ray diffraction study of the surface of a 0.24Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIN-PMN-PT) [011] poled rhombohedral single crystal. The near surface microstructure (the top several tens to hundreds of unit cells) was measured in situ under an applied electric field. The strains calculated from the change in lattice parameters have been compared to the macroscopic strain measured with a strain gauge affixed to the sample surface. The depth dependence of the electrostrain at the crystal surface was investigated as a function of temperature. The analysis revealed hidden sweet spots featuring unusually high strains that were observed as a function of depth, temperature and orientation of the lattice planes.
Recommended Citation
Cain, Markys G.; Staruch, Margo; Thompson, Paul; Lucas, Christopher; Wermeille, Didier; Kayser, Yves; Beckhoff, Burkhard; Lofland, Sam E.; Finkel, Peter. (2020). "In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction" Crystals 10, no. 9: 728. https://doi.org/10.3390/cryst10090728
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.
Comments
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.